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DSC-ISS-Calibration ISS-3-650-1250
Designcon DSC-ISS-Calibration ISS-3-650-1250 Supported Probe Pitch:650μm~1250μmAn ISS (Impedance Standard Substrate)…
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DSC-ISS-Calibration ISS-2-300-600
Designcon DSC-ISS-Calibration ISS-2-300-600 Supported Probe Pitch:300μm~600μmAn ISS (Impedance Standard Substrate)…
DSC-ISS-Calibration ISS-1-75-250
Designcon DSC-ISS-Calibration ISS-1-75-250 Supported Probe Pitch:75μm~250μmAn ISS (Impedance Standard Substrate)…
DC Probe Card
Designcon DC Probe Card Mainly used for wafer-level DC and…
RF+DC Probe Card
Designcon RF+DC Probe Card Used in scenarios that require both…
DELTA-L Probes
Designcon DSK-F40-SS-500-DELTA-L The Delta-L probe is a probe designed for…
Cryogenic Probes
Designcon DSK-F40-GSG-MW/TU2 Pitch Range:40μm~1250μmFor high-precision, high-frequency measurement scenarios sensitive to…
Single-hole Probes
Designcon DSK-F40-GSG-SH Pitch Range:40μm~1250μm• Able to avoid adjacent pins, fixtures,…
67GHz-GSSG-AJ
Designcon DSK-F67-GSSG-AJ G-to-S Pitch Range:40μm~1250μmDifferential testing compatible with multiple spacings,…
40GHz-GSSG-AJ
Designcon DSK-F40-GSSG-AJ G-to-S Pitch Range:40μm~1250μmDifferential testing compatible with multiple spacings,…