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Designcon

Dual-sided Probing System

The Dual-sided Probing System is engineered for exceptional versatility, supporting a wide range of complex testing configurations such as suspended dual-sided probing, orthogonal board testing, lateral (side-entry) probing, multi-board docking, and hybrid cable-plus-probe setups. With no restrictions on product dimensions, it is a universal solution for testing devices of all types and sizes. Designcon is currently the industry’s sole provider offering this level of comprehensive compatibility.

Suspended Dual-Sided

Test Environments

Orthogonal Board

Test Environments

lateral (side-entry) probing

Test Environments

no restrictions on dimensions

Test Environments

Test Environments

WORKFLOW

From Concept to Vacuum

Custom your probes in a week.

1

Consultation

Confirm your probe requirements.

2

Design

Design according to your requirements.

3

Delivery time

Probes in a week.

4

Technical Support

Lightning-fast technical support response.